Efficiency Degradation Analysis in Wideband Power Amplifiers

AuthID
 P-00Q-18J
4
Author(s)
Nunes, LC
·
Barros, DR
·
Document Type
Article
Year published
2018
Published
in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, ISSN: 0018-9480
Volume: 66, Issue: 12, Pages: 5640-5651 (12)
Conference
Ieee-Mtt-Society International Microwave Symposium (Ims), Date: JUN 10-15, 2018, Location: Philadelphia, PA, Sponsors: IEEE, IEEE MTT Soc, RFIC, ARFTG, IMBIoC, IMS
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Publication Identifiers
SCOPUS: 2-s2.0-85054485832
Wos: WOS:000453528100028
Source Identifiers
ISSN: 0018-9480
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