High-Resolution Nondestructive Test Probes Based on Magnetoresistive Sensors

AuthID
 P-00Q-J92
11
Author(s)
Caetano, DM
·
Rabuske, T
·
Pelkner, M
·
Fermon, C
·
Ribes, B
·
Francoe, F
·
Paul, J
·
Document Type
Article
Year published
2019
Published
in IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, ISSN: 0278-0046
Volume: 66, Issue: 9, Pages: 7326-7337 (12)
Indexing
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Scopus®
Crossref®37
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85056340743
Wos: WOS:000467010400068
Source Identifiers
ISSN: 0278-0046
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