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Small Al Cluster Ion Implantation into Si and 4H-Sic
AuthID
P-00Q-YDT
11
Author(s)
Zeng, XM
·
Pelenovich, V
·
Ieshkin, A
·
Danilov, A
·
Tolstogouzov, A
·
Zuo, WB
·
Ranjana, J
·
Hu, DH
·
Devi, N
·
Fu, DJ
·
Xiao, XH
Document Type
Article
Year published
2019
Published
in
RAPID COMMUNICATIONS IN MASS SPECTROMETRY,
ISSN: 0951-4198
Volume: 33, Issue: 18, Pages: 1449-1454 (6)
Indexing
Wos
®
Scopus
®
Crossref
®
5
Pubmed
®
Google Scholar
®
Metadata
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Publication Identifiers
DOI
:
10.1002/rcm.8489
Pubmed
: 31128075
Scopus
: 2-s2.0-85070483335
Wos
: WOS:000480285100004
Source Identifiers
ISSN
: 0951-4198
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