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Automating Orthogonal Defect Classification Using Machine Learning Algorithms
AuthID
P-00R-3RF
5
Author(s)
Lopes, F
·
Agnelo, J
·
Teixeira, CA
·
Laranjeiro, N
·
Bernardino, J
Document Type
Article
Year published
2020
Published
in
FUTURE GENERATION COMPUTER SYSTEMS-THE INTERNATIONAL JOURNAL OF ESCIENCE,
ISSN: 0167-739X
Volume: 102, Pages: 932-947 (16)
Indexing
Wos
®
Scopus
®
Dblp
®
/en/publications/view/790287
Crossref
®
35
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/j.future.2019.09.009
DBLP
: journals/fgcs/LopesATLB20
SCOPUS
: 2-s2.0-85072711357
Wos
: WOS:000501936300076
Source Identifiers
ISSN
: 0167-739X
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