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Enhanced Sputtering Yield of Nanostructured Samples Under Ar+ Cluster Bombardment
AuthID
P-00R-EAH
12
Author(s)
Pelenovich, V
·
Zeng, XM
·
Zuo, WB
·
Tolstogouzov, A
·
Gololobov, G
·
Suvorov, D
·
Slivkin, E
·
Hu, DH
·
Tian, CX
·
Neena, D
·
Fu, DJ
·
Yang, B
Document Type
Article
Year published
2020
Published
in
VACUUM,
ISSN: 0042-207X
Volume: 172, Pages: 109096 (6)
Indexing
Wos
®
Scopus
®
Crossref
®
5
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®
Metadata
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Publication Identifiers
DOI
:
10.1016/j.vacuum.2019.109096
Scopus
: 2-s2.0-85075531117
Wos
: WOS:000509788900058
Source Identifiers
ISSN
: 0042-207X
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