Electronic and Phonon Instabilities in Bilayer Graphene Under Applied External Bias

AuthID
 P-00R-RD8
7
Author(s)
Santos, MC
·
Skelton, JM
·
Yang, T
·
Santos, T
·
Parker, SC
·
Walsh, A
Document Type
Proceedings Paper
Year published
2020
Published
in MATERIALS TODAY-PROCEEDINGS, ISSN: 2214-7853
Volume: 20, Pages: 373-382 (10)
Conference
11Th International Conference on Advanced Nanomaterials (Anm), Date: JUL 18-20, 2018, Location: Univ Aveiro, Aveiro, PORTUGAL, Host: Univ Aveiro
Indexing
Wos®
Publication Identifiers
Wos: WOS:000512898100018
Source Identifiers
ISSN: 2214-7853
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