Characterisation of Negative-U Defects in Semiconductors

AuthID
 P-00S-842
3
Author(s)
Markevich, VP
·
Peaker, AR
Document Type
Review
Year published
2020
Published
in JOURNAL OF PHYSICS-CONDENSED MATTER, ISSN: 0953-8984
Volume: 32, Issue: 32, Pages: 323001 (25)
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85088536688
Wos: WOS:000536074800001
Source Identifiers
ISSN: 0953-8984
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