Compositional Analysis by Rbs, Xps and Edx of Zno:al,Bi and Zno:ga,Bi Thin Films Deposited by D.c. Magnetron Sputtering (Vol 161, Pg 268, 2019)

AuthID
P-00S-ER2
9
Author(s)
Ribeiro, JM
·
Correia, FC
·
Salvador, PB
·
Rebouta, L
·
Mendes, A
·
Document Type
Correction
Year published
2020
Published
in VACUUM, ISSN: 0042-207X
Volume: 180
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85087622917
Wos: WOS:000566762900003
Source Identifiers
ISSN: 0042-207X
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