Publications

Classification of Experimental Errors Done in Visir with Simple Alternated Current Circuits

AuthID
P-00S-EYA

Author(s)

Mendonca, LN

Macaneiro, M

Alves, GR

Pires, DS

Garcia Zumbia, J

Cuadros, J

Serrano, V

Editor(s)

Cardoso,A;Alves,GR;Restivo,MT

Document Type

Proceedings Paper

Year published

2020

Published

in PROCEEDINGS OF THE 2020 IEEE GLOBAL ENGINEERING EDUCATION CONFERENCE (EDUCON 2020) in IEEE Global Engineering Education Conference, ISSN: 2165-9567

Volume: 2020-April, Pages: 1568-1572 (5)

Conference

Ieee Global Engineering Education Conference (Ieee Educon), Date: APR 27-30, 2020, Location: ELECTR NETWORK, Sponsors: IEEE, P Porto, U Porto, Univ Coimbra, IEEE Educ Soc, MathWorks, REN, Keysight Technologies, Schweitzer Engn Labs, Rohde & Schwarz, Comtrade, Continental, Symington

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