Publications

Locating and Imaging Impact Damage with an Integrated System of Pzt and Eddy Current Probe

AuthID
P-00S-T30

Author(s)

Feng, B

Pasadas, DJ

Ribeiro, AL

Ramos, HG

Document Type

Proceedings Paper

Year published

2019

Published

in 2019 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281

Pages: 142-147 (6)

Conference

Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 20-23, 2019, Location: Auckland, NEW ZEALAND, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, Auckland Bioengineering Inst, Natl Instruments, RF Test Solut & ADLINK, Measurement Stand Lab New Zealand

Indexing