Excess Electronic Recoil Events in Xenon1T

AuthID
P-00S-WCT
139
Author(s)
Aprile, E
·
Aalbers, J
·
Agostini, F
·
Alfonsi, M
·
Althueser, L
·
Antochi, VC
·
Angelino, E
·
Angevaare, JR
·
[+13]·
[+43]·
[+36]·
[+27]·
Xu, Z
·
Yamashita, M
·
Ye, J
·
Zavattini, G
·
Zhang, Y
·
Zhu, T
·
Zopounidis, JP
·
Mougeot, X
1
Group Author(s)
XENON Collaboration
Document Type
Article
Year published
2020
Published
in PHYSICAL REVIEW D, ISSN: 1550-7998
Volume: 102, Issue: 7
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85096475839
Wos: WOS:000576891900002
Source Identifiers
ISSN: 1550-7998
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Name Order Name   Name Order Name   Name Order Name
1 Aprile, E;   2 Aalbers, J;   3 Agostini, F;
4 Alfonsi, M;   5 Althueser, L;   6 Amaro, FD;
7 Antochi, VC;   8 Angelino, E;   9 Angevaare, JR;
10 Arneodo, F;   11 Barge, D;   12 Baudis, L;
13 Bauermeister, B;   14 Bellagamba, L;   15 Benabderrahmane, ML;
16 Berger, T;   17 Brown, A;   18 Brown, E;
19 Bruenner, S;   20 Bruno, G;   21 Budnik, R;
22 Capelli, C;   23 Cardoso, JMR;   24 Cichon, D;
25 Cimmino, B;   26 Clark, M;   27 Coderre, D;
28 Colijn, AP;   29 Conrad, J;   30 Cussonneau, JP;
31 Decowski, MP;   32 Depoian, A;   33 Di Gangi, P;
34 Di Giovanni, A;   35 Di Stefano, R;   36 Diglio, S;
37 Elykov, A;   38 Eurin, G;   39 Ferella, AD;
40 Fulgione, W;   41 Gaemers, P;   42 Gaior, R;
43 Galloway, M;   44 Gao, F;   45 Grandi, L;
46 Hasterok, C;   47 Hils, C;   48 Hiraide, K;
49 Hoetzsch, L;   50 Howlett, J;   51 Iacovacci, M;
52 Itow, Y;   53 Joerg, F;   54 Kato, N;
55 Kazama, S;   56 Kobayashi, M;   57 Koltman, G;
58 Kopec, A;   59 Landsman, H;   60 Lang, RF;
61 Levinson, L;   62 Lin, Q;   63 Lindemann, S;
64 Lindner, M;   65 Lombardi, F;   66 Long, J;
67 Lopes, JAM ;   68 Fune, EL;   69 Macolino, C;
70 Mahlstedt, J;   71 Mancuso, A;   72 Manenti, L;
73 Manfredini, A;   74 Marignetti, F;   75 Undagoitia, TM;
76 Martens, K;   77 Masbou, J;   78 Masson, D;
79 Mastroianni, S;   80 Messina, M;   81 Miuchi, K;
82 Mizukoshi, K;   83 Molinario, A;   84 Mora, K;
85 Moriyama, S;   86 Mosbacher, Y;   87 Murra, M;
88 Naganoma, J;   89 Ni, K;   90 Oberlack, U;
91 Odgers, K;   92 Palacio, J;   93 Pelssers, B;
94 Peres, R;   95 Pienaar, J;   96 Pizzella, V;
97 Plante, G;   98 Qin, J;   99 Qiu, H;
100 Garcia, DR;   101 Reichard, S;   102 Rocchetti, A;
103 Rupp, N;   104 dos Santos, JMF;   105 Sartorelli, G;
106 Sarcevic, N;   107 Scheibelhut, M;   108 Schreiner, J;
109 Schulte, D;   110 Schumann, M;   111 Lavina, LS;
112 Selvi, M;   113 Semeria, F;   114 Shagin, P;
115 Shockley, E;   116 Silva, M;   117 Simgen, H;
118 Takeda, A;   119 Therreau, C;   120 Thers, D;
121 Toschi, F;   122 Trinchero, G;   123 Tunnell, C;
124 Vargas, M;   125 Volta, G;   126 Wang, H;
127 Wei, Y;   128 Weinheimer, C;   129 Weiss, M;
130 Wenz, D;   131 Wittweg, C;   132 Xu, Z;
133 Yamashita, M;   134 Ye, J;   135 Zavattini, G;
136 Zhang, Y;   137 Zhu, T;   138 Zopounidis, JP;
139 Mougeot, X;