REVIEW: Machine Learning Techniques in Analog/Rf Integrated Circuit Design, Synthesis, Layout, and Test

AuthID
 P-00T-7H7
4
Author(s)
Afacan, E
·
Dundar, G
Document Type
Review
Year published
2021
Published
in INTEGRATION-THE VLSI JOURNAL, ISSN: 0167-9260
Volume: 77, Pages: 113-130 (18)
Indexing
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Scopus®
Crossref®59
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Publication Identifiers
SCOPUS: 2-s2.0-85097708700
Wos: WOS:000611892300001
Source Identifiers
ISSN: 0167-9260
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