LOCK-V: A Heterogeneous Fault Tolerance Architecture Based on Arm and Risc-V*

AuthID
 P-00T-TH9
5
Author(s)
Marques, I
·
Rodrigues, C
·
Pinto, S
·
Gomes, T
Document Type
Article
Year published
2021
Published
in MICROELECTRONICS RELIABILITY, ISSN: 0026-2714
Volume: 120, Pages: 114120 (8)
Indexing
Wos®
Scopus®
Crossref®12
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85104116030
Wos: WOS:000663147500016
Source Identifiers
ISSN: 0026-2714
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