Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Perovskite Metal-Oxide-Semiconductor Structures for Interface Characterization
AuthID
P-00V-FBX
14
Author(s)
Cunha, JMV
·
Barreiros, MA
·
Curado, MA
·
Lopes, TS
·
Oliveira, K
·
Oliveira, AJN
·
Barbosa, JRS
·
Vilanova, A
·
Brites, MJ
·
Mascarenhas, J
·
Flandre, D
·
Silva, AG
·
Fernandes, PA
·
Salome, PMP
Document Type
Article in Press
Year published
2021
Published
in
ADVANCED MATERIALS INTERFACES,
ISSN: 2196-7350
Volume: 8, Issue: 20, Pages: 2101004 (12)
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1002/admi.202101004
SCOPUS
: 2-s2.0-85115686064
Wos
: WOS:000700082800001
Source Identifiers
ISSN
: 2196-7350
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service