Statistical N-Best Afd-Based Sparse Representation for Ecg Biometric Identification

AuthID
P-00V-RJV
5
Author(s)
Tan, CY
·
Zhang, LM
·
Qian, T
·
Document Type
Article
Year published
2021
Published
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 70, Pages: 1-13 (13)
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Publication Identifiers
DBLP: journals/tim/TanZQBP21
Wos: WOS:000749887400010
Source Identifiers
ISSN: 0018-9456
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