The Impact of Long-Term Memory Effects on the Linearizability of Gan Hemt-Based Power Amplifiers

AuthID
 P-00W-627
7
Author(s)
Gomes, JL
·
Nunes, LC
·
Barradas, FM
·
Cooman, A
·
de Jong, AEF
·
Heeres, RM
·
Document Type
Article
Year published
2022
Published
in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, ISSN: 0018-9480
Volume: 70, Issue: 2, Pages: 1377-1390 (14)
Indexing
Wos®
Scopus®
Crossref®12
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85122066688
Wos: WOS:000753493000042
Source Identifiers
ISSN: 0018-9480
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service