On the Drain-To-Source Capacitance of Microwave Fets in Triode Region

AuthID
 P-00X-AJ8
3
Author(s)
Gomes, JL
·
Nunes, LC
·
Document Type
Proceedings Paper
Year published
2022
Published
in 2022 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS 2022) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Volume: 2022-June, Pages: 333-335 (3)
Conference
Ieee/Mtt-S International Microwave Symposium (Ims), Date: JUN 19-24, 2022, Location: Denver, CO, Sponsors: IEEE,IEEE Microwave Theory & Tech Soc,RFIC,ARFTG,Analog Devices,Qorvo,Amplitech Grp,Rohde & Schwarz,Anokiwave,Cacence,Eravant,GlobalFoundries,Macom,MouryMicrowave,Millimeter Wave Prod Inc,Wolfspeed,XMA
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Publication Identifiers
SCOPUS: 2-s2.0-85130229100
Wos: WOS:000862782300084
Source Identifiers
ISSN: 0149-645X
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