Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
A Parasitic Resistance Extraction Tool Leveraged by Image Processing
AuthID
P-00X-K5X
3
Author(s)
Dias, D
·
Goes, J
·
Costa, T
Document Type
Proceedings Paper
Year published
2022
Published
in
2022 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 22)
in
IEEE International Symposium on Circuits and Systems,
ISSN: 0271-4302
Volume: 2022-May, Pages: 1585-1589 (5)
Conference
Ieee International Symposium on Circuits and Systems (Iscas),
Date:
MAY 28-JUN 01, 2022,
Location:
Austin, TX
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/iscas48785.2022.9937879
SCOPUS
: 2-s2.0-85142526969
Wos
: WOS:000946638601167
Source Identifiers
ISSN
: 0271-4302
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service