Publications

AuthID
P-00Y-1Z9

Author(s)

Subramaniyan, S

Ferraz, O

Ashuthosh, MR

Krishna, S

Wang, GH

Cavallaro, JR

Purnaprajna, M

Document Type

Article

Year published

2023

Published

in IEEE DESIGN & TEST, ISSN: 2168-2356

Volume: 40, Issue: 1, Pages: 85-95 (11)

Indexing

Wos^®

Crossref^®1

Google Scholar^®

Publication Identifiers

DOI: 10.1109/mdat.2022.3202852

Wos: WOS:000922874600011

Source Identifiers

ISSN: 2168-2356

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