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Extracting Defect Profiles in Ion-Implanted Gan from Ion Channeling
AuthID
P-00Y-QR6
6
Author(s)
Caçador, A
·
Jóźwik, P
·
Magalhães, S
·
Marques, JG
·
Wendler, E
·
Lorenz, K
Document Type
Article
Year published
2023
Published
in
Materials Science in Semiconductor Processing,
ISSN: 1369-8001
Volume: 166, Pages: 107702
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Publication Identifiers
DOI
:
10.1016/j.mssp.2023.107702
SCOPUS
: 2-s2.0-85164220678
Source Identifiers
ISSN
: 1369-8001
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