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Exploring Error Bits for Memory Failure Prediction: An In-Depth Correlative Study

AuthID
P-00Z-QQC

Author(s)

Yu, Q

Zhang, WG

Cardoso, J

Kao, O

Document Type

Proceedings Paper

Year published

2023

Published

in 2023 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, ICCAD in ICCAD-IEEE ACM International Conference on Computer-Aided Design, ISSN: 1933-7760

Conference

42Nd Ieee/Acm International Conference on Computer-Aided Design (Iccad), Date: OCT 28-NOV 02, 2023, Location: San Francisco, CA

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Publication Identifiers

DOI: 10.1109/iccad57390.2023.10323692

SCOPUS: 2-s2.0-85181399973

Wos: WOS:001116715100046

Source Identifiers

ISSN: 1933-7760

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Exploring Error Bits for Memory Failure Prediction: An In-Depth Correlative Study

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