Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Raised Source Drain Metal Diffusion in Finfet
AuthID
P-00Z-Z9P
4
Author(s)
Raveendra, G
·
Nesama, IFP
·
Rijo, PC
·
Prabha, VL
Document Type
Proceedings Paper
Year published
2013
Published
in
PROCEEDINGS OF 2013 INTERNATIONAL CONFERENCE ON CIRCUITS, POWER AND COMPUTING TECHNOLOGIES (ICCPCT 2013)
Pages: 741-745 (5)
Indexing
Wos
®
Metadata
Sources
Publication Identifiers
Wos
: WOS:000394455600129
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service