Dielectric Multilayers Impact on Radiation-Induced Charge Accumulation in Highly Sensitive Oxide Field Effect Transistors

AuthID
 P-010-26H
7
Author(s)
Bordoni, C
·
Ciavatti, A
·
Cortinhal, M
·
Pereira, M
·
Cramer, T
·
Fraboni, B
Document Type
Article
Year published
2024
Published
in APL MATERIALS, ISSN: 2166-532X
Volume: 12, Issue: 3
Indexing
Wos®
Scopus®
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Publication Identifiers
Scopus: 2-s2.0-85186756576
Wos: WOS:001180028900004
Source Identifiers
ISSN: 2166-532X
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