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Improved Accuracy and Robustness of Electron Density Profiles from Jet's X-Mode Frequency-Modulated Continuous-Wave Reflectometers

AuthID
P-010-8RH

Author(s)

Morales, RB

Salmi, A

Abreu, P

Amador, CHS

Appel, L

Carman, P

Fessey, J

Flanagan, J

Fontana, M

Frassinetti, L

[+1]·

Hacquin, S

Heuraux, S

Meneses, L

Ronchi, G

Sabot, R

Silva, A

Sirinelli, A

Szepesi, G

Taylor, D

Terranova, D

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Document Type

Article

Year published

2024

Published

in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748

Volume: 95, Issue: 4

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Publication Identifiers

DOI: 10.1063/5.0176696

Pubmed: 38557886

SCOPUS: 2-s2.0-85189689134

Wos: WOS:001194725800010

Source Identifiers

ISSN: 0034-6748

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All authors

Name Order	Name	Name Order	Name	Name Order	Name
1	Morales, RB;	2	Salmi, A;	3	Abreu, P;
4	Amador, CHS;	5	Appel, L;	6	Carman, P;
7	Fessey, J;	8	Flanagan, J;	9	Fontana, M;
10	Frassinetti, L;	11	Giroud, C;	12	Hacquin, S;
13	Heuraux, S;	14	Meneses, L;	15	Ronchi, G;
16	Sabot, R;	17	Silva, A;	18	Sirinelli, A;
19	Szepesi, G;	20	Taylor, D;	21	Terranova, D;

Improved Accuracy and Robustness of Electron Density Profiles from Jet's X-Mode Frequency-Modulated Continuous-Wave Reflectometers

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Improved Accuracy and Robustness of Electron Density Profiles from Jet's X-Mode Frequency-Modulated Continuous-Wave Reflectometers

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