The Impact of a Taper Impedance Transformation on the Trl De-Embedding Error

AuthID
 P-010-MCX
5
Author(s)
Louro, J
·
Nunes, LC
·
Barradas, FM
·
Pedro, JC
Document Type
Article in Press
Year published
2024
Published
in IEEE JOURNAL OF MICROWAVES
Volume: 4, Issue: 3, Pages: 389-403 (15)
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Publication Identifiers
Wos: WOS:001242872600001
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