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Thermal Fluctuation Noise in a Voltage Biased Superconducting Transition Edge Thermometer
AuthID
P-011-P06
7
Author(s)
Hoevers, HFC
·
Bento, AC
·
Bruijn, MP
·
Gottardi, L
·
Korevaar, MAN
·
Mels, WA
·
de Korte, PAJ
Document Type
Article
Year published
2000
Published
in
Applied Physics Letters,
ISSN: 0003-6951
Volume: 77, Issue: 26, Pages: 4422-4424
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50
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Publication Identifiers
DOI
:
10.1063/1.1336550
Source Identifiers
ISSN
: 0003-6951
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