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Space Charge Measurements with Kelvin Probe Force Microscopy
AuthID
P-011-YS8
3
Author(s)
Faliya, K
·
Kliem, H
·
Dias, CJ
Document Type
Article
Year published
2017
Published
in
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,
ISSN: 1070-9878
Volume: 24, Issue: 3, Pages: 1913-1922 (10)
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®
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Publication Identifiers
DOI
:
10.1109/tdei.2017.006457
Wos
: WOS:000405000300066
Source Identifiers
ISSN
: 1070-9878
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