Ion Beam Analysis of Ge/Si Dots Grown on Ultrathin Sio≪Sub≫2≪/Sub≫ Interlayers

AuthID
 P-012-5CB
6
Author(s)
Fonseca, A
·
Leitão, JP
·
Sobolev, NA
·
Carmo, MC
·
Nikiforov, AI
Document Type
Article
Year published
2006
Published
in Materials Science Forum
Volume: 514-516, Pages: 1121-1124
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