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Ion Beam Induced Current Analysis in Gan Microwires
AuthID
P-012-5CS
9
Author(s)
Verheij, D
·
Peres, M
·
Cardoso, S
·
Alves, LC
·
Alves, E
·
Durand, C
·
Eymery, J
·
Fernandes, J
·
Lorenz, K
2
Editor(s)
Almeida,B;Agostinho Moreira,J
Document Type
Article
Year published
2020
Published
in
EPJ Web of Conferences
Volume: 233, Pages: 05001
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Publication Identifiers
DOI
:
10.1051/epjconf/202023305001
Handle
:
https://hdl.handle.net/10451/49155
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