Silicon Gradient Related Phase Coexistence in Cr-Si?

AuthID
 P-012-Q2B
4
Author(s)
Pearce A.
·
Baruchel J.
·
Palmer S.B.
·
Document Type
Article
Year published
1990
Published
in Nondestructive Testing and Evaluation, ISSN: 10589759
Volume: 5, Issue: 5-6, Pages: 369-377 (8)
Indexing
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-84914042769
Source Identifiers
ISSN: 10589759
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