Dosimetric Study Of Changes Due To X-Ray Doses In Dielectric Conductance Of Thin-Film Capacitors

AuthID
 P-014-YW9
2
Author(s)
SINGH, P
·
Document Type
Note
Year published
1974
Published
in INDIAN JOURNAL OF PURE & APPLIED PHYSICS, ISSN: 0019-5596
Volume: 12, Issue: 2, Pages: 165-166 (2)
Indexing
Wos®
Publication Identifiers
Wos: WOS:A1974T780900023
Source Identifiers
ISSN: 0019-5596
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service