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Characterization Of Vertical-Cavity Semiconductor Structures
AuthID
P-014-YXE
6
Author(s)
CHRISTENSEN, DH
·
PELLEGRINO, JG
·
HICKERNELL, RK
·
CROCHIERE, SM
·
PARSONS, CA
·
RAI, RS
Document Type
Article
Year published
1992
Published
in
JOURNAL OF APPLIED PHYSICS,
ISSN: 0021-8979
Volume: 72, Issue: 12, Pages: 5982-5989 (8)
Indexing
Wos
®
Crossref
®
15
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1063/1.351908
Wos
: WOS:A1992KC85000065
Source Identifiers
ISSN
: 0021-8979
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