Aluminium Incorporation in AlXGa1 - XN/Gan Heterostructures: A Comparative Study by Ion Beam Analysis and X-Ray Diffraction

AuthID
 P-015-GY6
7
Author(s)
Gago R.
·
González-Posada F.
·
Kreissig U.
·
di Forte Poisson M.A.
·
Braña A.F.
·
Muñoz E.
Document Type
Article
Year published
2008
Published
in Thin Solid Films, ISSN: 00406090
Volume: 516, Issue: 23, Pages: 8447-8452 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-51149095785
Source Identifiers
ISSN: 00406090
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