Publications

BUGOUT: Automated Test Generation and Bug Detection for Low-Code

AuthID
P-017-2YC

Author(s)

Coutinho, J

Lemos, A

Terra-Neves, M

Ribeiro, A

Manquinho, V

Quintino, R

Matejczyk, B

Document Type

Proceedings Paper

Year published

2024

Published

in 2024 IEEE CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION, ICST 2024 in IEEE International Conference on Software Testing Verification and Validation, ISSN: 2381-2834

Pages: 373-382 (10)

Conference

17Th Ieee International Conference on Software Testing, Verification, and Validation (Icst), Date: MAY 27-31, 2024, Location: Toronto, CANADA

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/icst60714.2024.00041

Scopus: 2-s2.0-85203787713

Wos: WOS:001307930000033

Source Identifiers

ISSN: 2381-2834

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