Departamento de Física (DF)
Polytechnic Institute of Coimbra (IPC) :: Instituto Superior de Engenharia de Coimbra (ISEC) :: Departamento de Física e Matemática
An Authenticus institution (group) is an organization which consists of a set of researchers (institutional/group team). The set of researchers depends on the organizational structure of the institution per year and can be set at the institution profile, under ‘Researchers’ interface. Based on the institutional team we produce listings of publications, statistics and institutional reports.
Publications displayed at an Authenticus institutional profile depend on two parameters:
- Researchers team associated with the institution per year.
- Publications source type.
We define 3 types of publication sources:
- Validated by team members - includes all publications validated by team members. Requires the definition of the institutional team.
- All published by team members - includes all publications validated by the institution team members plus all not-validated (only identified) publications. Requires the definition of the institutional team.
- Affiliation Based - includes publications that have the institution/group in the publication affiliation. Does not require institutional team, but at the same time does not guarantee that all publications will be listed.
Only validated by team members publications are included.
Only the current year team is included in this action.>
The action is executed in the background, thus the results are NOT immediate.
This actions can be executed only once a month!
Only validated by current year team members publications are included.
The action is executed in the background, thus the results are NOT immediate.
This actions can be executed only once a day!
Publications Count: 669
5 Team MembersFilters -> Year: 2024
AUTHORS: Gomez Cadenas, JJG; Alvarez, V; Borges, FIG; Carcel, S; Castel, J; Cebrian, S; Cervera, A; Conde, CAN; Dafni, T; Dias, THVT; Diaz, J; Egorov, M; Esteve, R; Evtoukhovitch, P; Fernandes, LMP; Ferrario, P; Ferreira, AL; Freitas, EDC ; Gehman, VM; Gil, A; ...More
PUBLISHED: 2014, SOURCE: ADVANCES IN HIGH ENERGY PHYSICS, VOLUME: 2014, PAGES: 1-22
AUTHORS: Lopes, L; Assis, P; Blanco, A; Cerda, MA; Carolino, N; Cunha, O; Ferreira, M; Fonte, P ; Mendes, L; Palka, M; Pereira, A; Pimenta, M; Tome, B;
PUBLISHED: 2014, SOURCE: 12th Workshop on Resistive Plate Chambers and Related Detectors in JOURNAL OF INSTRUMENTATION, VOLUME: 9, ISSUE: 10
AUTHORS: Miguel Couceiro ; Paulo Crespo; Rui F Marques; Paulo Fonte ;
PUBLISHED: 2014, SOURCE: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOLUME: 61, ISSUE: 3, PAGES: 1153-1163
AUTHORS: Agakishiev, G; Balanda, A; Belver, D; Belyaev, A; Berger Chen, JC; Blanco, A; Boehmer, M; Boyard, JL; Cabanelas, P; Chernenko, S; Dybczak, A; Epple, E; Fabbietti, L; Fateev, O; Finocchiaro, P; Fonte, P ; Friese, J; Froehlich, I; Galatyuk, T; Garzon, JA; ...More
PUBLISHED: 2014, SOURCE: PHYSICS LETTERS B, VOLUME: 731, PAGES: 265-271
AUTHORS: Kornakov, G; Arnold, O; Atomssa, ET; Behnke, C; Belyaev, A; Berger Chen, JC; Biernat, J; Blanco, A; Blume, C; Bohmer, M; Bordalo, P; Chernenko, S; Deveaux, C; Dybczak, A; Epple, E; Fabbietti, L; Fateev, O; Fonte, P ; Franco, C; Friese, J; ...More
PUBLISHED: 2014, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 9, ISSUE: 11
AUTHORS: Martins, P; Blanco, A; Crespo, P; Fatima Ferreira Marques, MFF; Ferreira Marques, RF; Gordo, PM; Kajetanowicz, M; Korcyl, G; Lopes, L; Michel, J; Palka, M; Traxler, M; Fonte, P ;
PUBLISHED: 2014, SOURCE: 12th Workshop on Resistive Plate Chambers and Related Detectors in JOURNAL OF INSTRUMENTATION, VOLUME: 9, ISSUE: 10
AUTHORS: Blanco, A; Blanco, JJ; Collazo, J; Fonte, P ; Garzon, JA; Gomez, A; Kornakov, G; Kurtukian, T; Lopez Agueera, AL; Lopez, JM; Lopes, L; Morales, M; Morozova, A; Mourino, JC; Pais, MA; Palka, M; Perez Munuzuri, VP; Ribeiro, P; Rodriguez Cabo, IR; Sosa, I; ...More
PUBLISHED: 2014, SOURCE: 12th Workshop on Resistive Plate Chambers and Related Detectors in JOURNAL OF INSTRUMENTATION, VOLUME: 9, ISSUE: 9
AUTHORS: Milton P Macedo ; Correia, CMBA ;
PUBLISHED: 2013, SOURCE: Conference on Advanced Microscopy Techniques III in ADVANCED MICROSCOPY TECHNIQUES III, VOLUME: 8797
AUTHORS: Milton P Macedo ; Correiaa C.;
PUBLISHED: 2013, SOURCE: Optics InfoBase Conference Papers
AUTHORS: Fabbietti, L; Agakishiev, G; Behnke, C; Belver, D; Belyaev, A; J.C Berger-Chen; Blanco, A; Blume, C; Böhmer, M; Cabanelas, P; Chernenko, S; Dritsa, C; Dybczak, A; Epple, E; Fateev, O; Fonte, P ; Friese, J; Fröhlich, I; Galatyuk, T; J.A Garzón; ...More
PUBLISHED: 2013, SOURCE: Nuclear Physics A, VOLUME: 914, PAGES: 60-68
AUTHORS: Martins, P; Blanco, A; Crespo, P; Ferreira Marques, MF; Marques, RF; Gordo, PM; Kajetanowicz, M; Korcyl, G; Lopes, L; Michel, J; Palka, M; Traxler, M; Fonte, P ;
PUBLISHED: 2013, SOURCE: 2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 in IEEE Nuclear Science Symposium Conference Record
AUTHORS: Paulo Martins; Alberto Blanco; Paulo Crespo; Fatima Ferreira Marques, MFF; Rui Ferreira Marques; Paulo M Gordo; Marcin Kajetanowicz; Grzegorz Korcyl; Luis Lopes; Jan Michel; Marek Palka; Michael Traxler; Paulo Fonte ;
PUBLISHED: 2013, SOURCE: 60th IEEE Nuclear Science Symposium (NSS) / Medical Imaging Conference (MIC) / 20th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors in 2013 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC)
AUTHORS: Miguel Couceiro ; Lehtonen, E ; Waldhauser, T;
PUBLISHED: 2013, SOURCE: International Journal of Algebra and Computation, VOLUME: 23, ISSUE: 3, PAGES: 643-662
AUTHORS: Breuil, P; Fonte, P ; Nappi, E; Oliveira, R; Peskov, V;
PUBLISHED: 2013, SOURCE: EUROPEAN PHYSICAL JOURNAL PLUS, VOLUME: 128, ISSUE: 12
AUTHORS: Clemencio, FMC; Loureiro, CFM ; Fonte, P ; Landeck, J ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, VOLUME: 60, ISSUE: 4, PAGES: 2912-2917
AUTHORS: Agakishiev, G; Belver, D; Blanco, A; Boehmer, M; Boyard, JL; Cabanelas, P; Castro, E; Chernenko, S; Destefanis, M; Dohrmann, F; Dybczak, A; Epple, E; Fabbietti, L; Fateev, O; Finocchiaro, P; Fonte, P ; Friese, J; Froehlich, I; Galatyuk, T; Garzon, JA; ...More
PUBLISHED: 2013, SOURCE: EUROPEAN PHYSICAL JOURNAL A, VOLUME: 49, ISSUE: 11, PAGES: 1-5
AUTHORS: Fonte, P ;
PUBLISHED: 2013, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 8, ISSUE: 4
AUTHORS: Milton P Macedo ; Correia, CMBA ;
PUBLISHED: 2013, SOURCE: Conference on Optical Measurement Systems for Industrial Inspection VIII in OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VIII, VOLUME: 8788
AUTHORS: Agakishiev, G; Balanda, A; Belver, D; Belyaev, A; Berger Chen, JC; Blanco, A ; Boehmer, M; Boyard, JL; Cabanelas, P; Castro, E; Chernenko, S; Christ, T; Destefanis, M; Dohrmann, F; Dybczak, A; Epple, E; Fabbietti, L; Fateev, O; Finocchiaro, P; Fonte, P ; ...More
PUBLISHED: 2013, SOURCE: PHYSICAL REVIEW C, VOLUME: 87, ISSUE: 2
AUTHORS: Hiroki Kusano; Nobuyuki Hasebe; Hiroshi Nagaoka; Takuro Kodama; Yuki Oyama; Reiko Tanaka; Yoshiharu Amano; Kyeong J Kim; Jose A M Matias Lopes ;
PUBLISHED: 2013, SOURCE: SPIE Conference on Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV in HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS XV, VOLUME: 8852