Luis Miguel Nunes Pereira


AuthID: R-000-9RT

Confirmed Publications: 149



81
TITLE: Low temperature processed hafnium oxide: Structural and electrical properties  Full Text
AUTHORS: Pereira, L ; Barquinha, P ; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: Symposium on Characterization of High-K Dielectric Materials held at the 2006 E-MRS Spring Meeting in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 9, ISSUE: 6
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82
TITLE: Multicomponent wide band gap oxide semiconductors for thin film transistors
AUTHORS: Fortunato, E ; Barquinha, P ; Pereira, L ; Goncalves, G; Martins, R ;
PUBLISHED: 2006, SOURCE: 6th International Meeting on Information Displays/5th International Display Manufacturing Conference (IMID/IDMC 2006) in IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS, VOLUME: 2006
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83
TITLE: Multifunctional thin film zinc oxide semiconductors: Application to electronic devices
AUTHORS: Fortunato, E ; Goncalves, A; Marques, A; Pimentel, A ; Barquinha, P ; Aguas, H ; Pereira, L ; Raniero, L; Goncalves, G; Ferreira, I ; Martins, R ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS CrossRef: 6
IN MY: ORCID
84
TITLE: Nanostructure characterization of high k materials by spectroscopic ellipsometry  Full Text
AUTHORS: Pereira, L ; Aguas, H ; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: Symposium P of the Spring Meeting of the European-Materials-Research-Society entitled Curent Trends in Optical and X-ray Meterology of Advanced Materials for Nanoscale Devices in APPLIED SURFACE SCIENCE, VOLUME: 253, ISSUE: 1
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85
TITLE: Nickel-assisted metal-induced crystallization of silicon: Effect of native silicon oxide layer  Full Text
AUTHORS: Pereira, L ; Martins, RMS ; Schell, N; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: Symposium on Thin Film and Nanostructured Materials for Photovoltaics held at the 2005 EMRS Meeting in THIN SOLID FILMS, VOLUME: 511
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86
TITLE: Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization
AUTHORS: Pereira, L ; Barquinha, P ; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
87
TITLE: Spectroscopic ellipsometry study of nickel induced crystallization of a-Si  Full Text
AUTHORS: Pereira, L ; Aguas, H ; Beckers, M; Martins, RMS ; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
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88
TITLE: Study of nanostructured silicon by hydrogen evolution and its application in p-i-n solar cells  Full Text
AUTHORS: Raniero, L; Ferreira, I ; Pereira, L ; Aguas, H ; Fortunato, E ; Martins, R ;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
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89
TITLE: The influence of a poly-Si intermediate layer on the crystallization behaviour of Ni-TiSMA magnetron sputtered thin films  Full Text
AUTHORS: Martins, RMS; Fernandes, FMB ; Silva, RJC; Pereira, L ; Gordo, PR; Maneira, MJP; Beckers, M; Mucklich, A; Schell, N;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 83, ISSUE: 1
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90
TITLE: Amorphous silicon based p-i-i-n structure for color sensor
AUTHORS: Zhang, S; Raniero, L; Fortunato, E ; Pereira, L ; Aguas, H ; Ferreira, L; Martins, R ;
PUBLISHED: 2005, SOURCE: Symposium on Amorphous and Nanocrystalline Silicon Science and Technology held at the 2005 MRS Spring Meeting in Amorphous and Nanocrystalline Silicon Science and Technology-2005, VOLUME: 862
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