31
TITLE: Combined spectral and histogram analysis for fast ADC testing
AUTHORS: Serra, AC ; da Silva, MF; Ramos, PM ; Martins, RC ; Michaeli, L; Saliga, J;
PUBLISHED: 2005, SOURCE: 21st IEEE Instrumentation and Measurement Technology Conference in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 54, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
32
TITLE: Signal discrimination in superheated droplet detectors
AUTHORS: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
33
TITLE: SIMPLE dark matter search results  Full Text
AUTHORS: Girard, TA ; Giuliani, F; Morlat, T; da Costa, MF ; Collar, JI; Limagne, C; Waysand, G; Puibasset, J; Miley, HS; Auguste, M; Boyer, D; Cavaillou, A; Marques, JG ; Oliveira, C; Fernandes, AC; Ramos, AR ; Martins, RC ;
PUBLISHED: 2005, SOURCE: PHYSICS LETTERS B, VOLUME: 621, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef: 48
34
TITLE: Analog-to-digital converter testing - new proposals  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Martins, R ; da Silva, MF;
PUBLISHED: 2004, SOURCE: 4th International Conference on Advanced A/D and D/A Conversion Techniques/7th European Workshop on ADC Modelling and Testing in COMPUTER STANDARDS & INTERFACES, VOLUME: 26, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
35
TITLE: Automated methodology for modeling and measuring memoryless nonlinearities from the stochastic properties of a signal
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: 7th Africon Conference in Africa in 2004 IEEE AFRICON: 7TH AFRICON CONFERENCE IN AFRICA, VOLS 1 AND 2: TECHNOLOGY INNOVATION, VOLUME: 1
INDEXED IN: Scopus WOS
IN MY: ORCID
36
TITLE: Least-squares fitting algorithms applied to periodic signals  Full Text
AUTHORS: Da Silva, MF; Ramos, PM ; Martins, RC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 3
INDEXED IN: Scopus CrossRef
IN MY: ORCID
37
TITLE: Representation and measurement of nonlinearities in stimulus signals
AUTHORS: Martins, RC ; Serra, AMD ;
PUBLISHED: 2003, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
38
TITLE: Nonlinearity representation and PDF measurement of ADC testing signals  Full Text
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2002, SOURCE: 6th Euro Workshop on ADC Modelling and Testing (EWADC in MEASUREMENT, VOLUME: 32, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
39
TITLE: Representation and measurement of nonlinearities in stimulus signals
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2, VOLUME: 1
INDEXED IN: Scopus WOS
IN MY: ORCID
40
TITLE: ADC interbit modulation: description, detection and quantification  Full Text
AUTHORS: Martins, RC ; Serra, AMD ;
PUBLISHED: 2001, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 23, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
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