Rodrigo Ferrao Paiva Martins


AuthID: R-000-FKV

Confirmed Publications: 493



331
TITLE: Correlation between the carbon and hydrogen contents with the gas species and the plasma impedance of silicon carbide films produced by PECVD technique  Full Text
AUTHORS: Martins, R ; Silva, V; Aguas, H ; Cabrita, A; Ferreira, I ; Fortunato, E ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in APPLIED SURFACE SCIENCE, VOLUME: 184, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
332
TITLE: Correlation between the microscopic and macroscopic characteristics of SnO2 thin film gas sensors  Full Text
AUTHORS: Lopes, A; Fortunato, E ; Nunes, P; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef: 5
IN MY: ORCID | ResearcherID
333
TITLE: Effect of deposition conditions upon gas sensitivity of zinc oxide thin films deposited by spray pyrolysis
AUTHORS: Nunes, P; Fortunato, E ; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: 6th International Conference on Polycrystalline Semiconductors in POLYCRYSTALLINE SEMICONDUCTORS IV MATERIALS, TECHNOLOGIES AND LARGE AREA ELECTRONICS, VOLUME: 80-81
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
334
TITLE: Effect of different dopants on the properties of ZnO thin films  Full Text
AUTHORS: Nunes, P; Fortunato, E ; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
335
TITLE: Fast and cheap method to qualitatively measure the thickness and uniformity of ZrO2 thin films  Full Text
AUTHORS: Aguas, H ; Marques, A; Martins, R ; Fortunato, E ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 4, ISSUE: 1-3
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
336
TITLE: Hydrogenated amorphous silicon / ZnO shottky heterojunction for position sensitive detectors
AUTHORS: Aguas, H ; Nunes, P; Fortunato, E ; Silva, R; Silva, V; Figueiredo, J; Soares, F; Martins, R ;
PUBLISHED: 2001, SOURCE: Amorphous and Heterogeneous Silicon Based Films 2001 in Materials Research Society Symposium - Proceedings, VOLUME: 664
INDEXED IN: Scopus
IN MY: ORCID
337
TITLE: Influence of the annealing conditions on the properties of ZnO thin films  Full Text
AUTHORS: Nunes, P; Fortunato, E ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
338
TITLE: Influence of the deposition conditions on the gas sensitivity of zinc oxide thin films deposited by spray pyrolysis  Full Text
AUTHORS: Nunes, P; Fortunato, E ; Lopes, A ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
339
TITLE: Influence of the post-treatment on the properties of ZnO thin films  Full Text
AUTHORS: Nunes, P; Fortunato, E ; Martins, R ;
PUBLISHED: 2001, SOURCE: 3rd Symposium O on Thin Film Materials for Large Area Electronics of the E-MRS 2000 Spring Meeting in THIN SOLID FILMS, VOLUME: 383, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
340
TITLE: Influence of the process parameters on structural and electrical properties of r.f. magnetron sputtering ITO films  Full Text
AUTHORS: Baia, I; Fernandes, B; Nunes, P; Quintela, M; Martins, R ;
PUBLISHED: 2001, SOURCE: 3rd Symposium O on Thin Film Materials for Large Area Electronics of the E-MRS 2000 Spring Meeting in THIN SOLID FILMS, VOLUME: 383, ISSUE: 1-2
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
Page 34 of 50. Total results: 493.

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