Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Vitor Hugo Mendes da Costa Carvalho
AuthID:
R-000-HK8
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (24)
Article (22)
Book Chapter (2)
Editorial Material (1)
Year Start - End:
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
-
2024
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
30
40
50
Confirmed Publications: 49
41
TITLE:
Optical yarn hairiness measurement system
AUTHORS:
Vitor H Carvalho
;
Paulo J Cardoso
;
Rosa M Vasconcelos
;
Filomena O Soares
;
Michael S Belsley
;
PUBLISHED:
2007
,
SOURCE:
5th IEEE International Conference on Industrial Informatics
in
2007 5TH IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS, VOLS 1-3,
VOLUME:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
42
TITLE:
Yarn-mass measurement with 1-mm-length samples
Full Text
AUTHORS:
Jose G Pinto
;
Vitor Carvalho
;
Joao L Monteiro
;
Rosa M Vasconcelos
;
Filomena O Soares
;
PUBLISHED:
2007
,
SOURCE:
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,
VOLUME:
54,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
43
TITLE:
Development of a yarn evenness measurement and hairiness analysis system
AUTHORS:
Carvalho, V
; Cardoso, P;
Belsley, M
;
Vasconcelos, RM
;
Soares, FO
;
PUBLISHED:
2006
,
SOURCE:
32nd Annual Conference of the IEEE-Industrial-Electronics-Society
in
IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11
INDEXED IN:
WOS
CrossRef
IN MY:
ORCID
44
TITLE:
Development of a yarn evenness measurement and hairiness analysis system
AUTHORS:
Carvalho, V
; Cardoso, P;
Belsley, M
;
Vasconcelos, RM
;
Soares, FO
;
PUBLISHED:
2006
,
SOURCE:
IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics
in
IECON Proceedings (Industrial Electronics Conference)
INDEXED IN:
Scopus
IN MY:
ORCID
45
TITLE:
Direct measurement of yarn mass with 1mm accuracy using capacitive sensors
AUTHORS:
Carvalho, V
; Monteiro, J;
Vasconcelos, R
;
Soares, FO
;
PUBLISHED:
2006
,
SOURCE:
10th World Multi-Conference on Systemics, Cybernetics and Informatics/12th International Conference on Information Systems Analysis and Synthesis
in
WMSCI 2006: 10TH WORLD MULTI-CONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL IV, PROCEEDINGS,
VOLUME:
4
INDEXED IN:
Scopus
WOS
Handle
IN MY:
ORCID
46
TITLE:
Yam parameterization based on mass analysis
Full Text
AUTHORS:
Carvalho, V
;
Pinto, JG
;
Monteiro, JL
;
Vasconcelos, RM
;
Soares, FO
;
PUBLISHED:
2004
,
SOURCE:
17th European Conference on Solid-State Transducers (Eurosensors XVII)
in
SENSORS AND ACTUATORS A-PHYSICAL,
VOLUME:
115,
ISSUE:
2-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
47
TITLE:
Yarn mass analysis with 1 mm capacitive sensors
AUTHORS:
Carvalho, V
;
Monteiro, J
;
Vasconcelos, RM
;
Soares, FO
;
PUBLISHED:
2004
,
SOURCE:
IEEE International Symposium on Industrial Electronics
in
Proceedings of the IEEE-ISIE 2004, Vols 1 and 2,
VOLUME:
1
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
48
TITLE:
Evaluation of the sample temperature increase during the quiescent and shear-induced isothermal crystallization of polyethylene
Full Text
AUTHORS:
Martins, JA
;
Zhang, W
;
Carvalho, V
;
Brito, AM
;
Soares, FO
;
PUBLISHED:
2003
,
SOURCE:
POLYMER,
VOLUME:
44,
ISSUE:
26
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
49
TITLE:
On-line measurement of yarn evenness
AUTHORS:
Carvalho, V
; Pinto, JG; Monteiro, J;
Vasconcelos, RM
;
Soares, FO
;
PUBLISHED:
2003
,
SOURCE:
IEEE International Symposium on Industrial Electronics
in
2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
INDEXED IN:
WOS
Handle
IN MY:
ORCID
Add to Marked List
Check All
Export
×
Publication Export Settings
BibTex
EndNote
APA
CSV
PDF
Export Preview
Print
×
Publication Print Settings
HTML
PDF
Print Preview
Page 5 of 5. Total results: 49.
<<
<
1
2
3
4
5
>
>>
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service