Rui Miguel dos Santos Martins


AuthID: R-000-J8Z

Confirmed Publications: 31



11
TITLE: Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometry  Full Text
AUTHORS: Pereira, L ; Aguas, H ; Beckers, M; Martins, RMS ; Fortunato, E ; Martins, R ;
PUBLISHED: 2008, SOURCE: 22nd International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 354, ISSUE: 19-25
INDEXED IN: Scopus WOS CrossRef
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12
TITLE: Role of the substrate on the growth of Ni-Ti sputtered thin films  Full Text
AUTHORS: Martins, RMS ; Schell, N; Beckers, M; Silva, RJC ; Mahesh, KK; Braz M B Fernandes ;
PUBLISHED: 2008, SOURCE: 7th European Symposium on Martensitic Transformations in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, VOLUME: 481, ISSUE: 1-2 C
INDEXED IN: Scopus WOS CrossRef
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13
TITLE: Study of graded Ni-Ti shape memory alloy film growth on Si(100) substrate  Full Text
AUTHORS: Martins, RMS ; Schell, N; Muecklich, A; Reuther, H; Beckers, M; Silva, RJC ; Pereira, L ; Braz M B Fernandes ;
PUBLISHED: 2008, SOURCE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 91, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
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14
TITLE: Texture development in Ni-Ti thin films
AUTHORS: Braz Fernandes, FM ; Martins, RMS ; Schell, N; Mahesh, KK; Silva, RJC ;
PUBLISHED: 2008, SOURCE: 3rd International Conference on Smart Materials, Structures and Systems - State-of-the-art Research and Application of SMAs Technologies, CIMTEC 2008 in CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - State-of-the-art Research and Application of SMAs Technologies, VOLUME: 59
INDEXED IN: Scopus
IN MY: ORCID
15
TITLE: The Interfacial Diffusion Zone in Magnetron Sputtered Ni-Ti Thin Films Deposited on Different Si Substrates Studied by HR-TEM
AUTHORS: Martins, RMS ; Beckers, M; Muecklich, A; Schell, N; Silva, RJC ; Mahesh, KK; Fernandes, FMB ;
PUBLISHED: 2008, SOURCE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
16
TITLE: Characterization of nickel induced crystallized silicon by spectroscopic ellipsornetry
AUTHORS: Luis Pereira ; Hugo Aguas ; Manfred Beckers; Rui M S Martins ; Elvira Fortunato ; Rodrigo Martins ;
PUBLISHED: 2007, SOURCE: Symposium on Amorphous and Polycrystalline Thin-Film Silicon Science and Technology held at the 2006 MRS Spring Meeting in AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2006, VOLUME: 910
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
17
TITLE: Corrigendum to "Nickel assisted metal induced crystallization of silicon: Effect of native silicon oxide layer"  Full Text
AUTHORS: Pereira, L ; Martins, RMS ; Schell, N; Fortunato, E ; Martins, R ;
PUBLISHED: 2007, SOURCE: THIN SOLID FILMS, VOLUME: 516, ISSUE: 1
INDEXED IN: Scopus WOS
IN MY: ResearcherID
18
TITLE: In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction  Full Text
AUTHORS: Martins, RMS ; Schell, N; Silva, RJC ; Pereira, L ; Mahesh, KK; Braz Fernandes, FMB ;
PUBLISHED: 2007, SOURCE: Symposium on Functional Materials for Micro and Nanosystems in SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 126, ISSUE: 1
INDEXED IN: Scopus WOS
IN MY: ResearcherID
19
TITLE: Growth of sputter-deposited Ni-Ti thin films: Effect of a SiO2 buffer layer  Full Text
AUTHORS: Martins, RMS ; Schell, N; Beckers, M; Mahesh, KK; Silva, RJC ; Fernandes, FMB ;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 84, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
20
TITLE: In-situ observation of Ni-Ti thin film growth by synchrotron radiation scattering
AUTHORS: Martins, RMS ; Fernandes, FMB ; Silva, RJC ; Beckers, M; Schell, N;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 2
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
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