91
TITLE: Introduction to special issue on ADC modelling and testing - 6th workshop on ADC modelling and testing  Full Text
AUTHORS: Daponte, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: ADC Modelling and Testing - 6th Workshop (ADC Modelling) in MEASUREMENT, VOLUME: 32, ISSUE: 4
INDEXED IN: Scopus WOS
92
TITLE: Nonlinearity representation and PDF measurement of ADC testing signals  Full Text
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2002, SOURCE: 6th Euro Workshop on ADC Modelling and Testing (EWADC in MEASUREMENT, VOLUME: 32, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
93
TITLE: Performance analysis of an ADC histogram test using small triangular waves
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
94
TITLE: Representation and measurement of nonlinearities in stimulus signals
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2002, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2, VOLUME: 1
INDEXED IN: Scopus WOS
IN MY: ORCID
95
TITLE: A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
AUTHORS: Arpaia, P; Serra, AMD ; Daponte, P; Monteiro, CL;
PUBLISHED: 2001, SOURCE: Instrumentation and Measurement Technology Conference (IMTC 2000) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
96
TITLE: A smart capacitive transducer with autocalibration capabilities
AUTHORS: Pereira, JMD; Postolache, O; Girao, PS; Serra, AC ;
PUBLISHED: 2001, SOURCE: 5th International Conference on Electronic Measurement and Instruments in ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS
INDEXED IN: WOS
97
TITLE: ADC histogram test by triangular small-waves
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
98
TITLE: ADC interbit modulation: description, detection and quantification  Full Text
AUTHORS: Martins, RC ; Serra, AMD ;
PUBLISHED: 2001, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 23, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
99
TITLE: Influence of frequency errors in the variance of the cumulative histogram
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2001, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
100
TITLE: Phase-spectrum analysis for detection of ADC hysteretic distortion
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
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