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António Manuel Cruz Serra
AuthID:
R-000-28E
Publications
Confirmed
To Validate
Document Source:
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Document Type:
All Document Types
Proceedings Paper (66)
Article (56)
Editorial Material (2)
Review (1)
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Order:
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Cit. WOS Dsc
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Results:
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Confirmed Publications: 125
31
TITLE:
Impedance measurement using multiharmonic least-squares waveform fitting algorithm
Full Text
AUTHORS:
Pedro M Ramos
;
Cruz C Serra
;
PUBLISHED:
2008
,
SOURCE:
COMPUTER STANDARDS & INTERFACES,
VOLUME:
30,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
32
TITLE:
Impedance measurement with sine-fitting algorithms implemented in a DSP portable device
AUTHORS:
Tomas Radil
;
Pedro M Ramos
;
Cruz C Serra
;
PUBLISHED:
2008
,
SOURCE:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
57,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
33
TITLE:
PQ monitoring system for real-time detection and classification of disturbances in a single-phase power system
AUTHORS:
Radil, T;
Ramos, PM
;
Janeiro, FM
;
Serra, AC
;
PUBLISHED:
2008
,
SOURCE:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
57,
ISSUE:
8
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
34
TITLE:
Uncertainty Analysis of Impedance Measurements Using DSP Implemented Ellipse Fitting Algorithms
Full Text
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Mouhaydine Tlemcani
;
Cruz C Serra
;
PUBLISHED:
2008
,
SOURCE:
25th IEEE Instrumentation and Measurement Technology Conference
in
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
35
TITLE:
Automated power quality monitoring system for on-line detection and classification of disturbances
Full Text
AUTHORS:
Matz, V; Radil, T;
Ramos, P
;
Serra, AC
;
PUBLISHED:
2007
,
SOURCE:
24th IEEE Instrumentation and Measurement Technology Conference
in
2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN:
Scopus
WOS
CrossRef
:
7
IN MY:
ORCID
36
TITLE:
DSP based power quality analyzer using new signal processing algorithms for detection and classification of disturbances in a single-phase power system
AUTHORS:
Ramos, PM
;
Radil, T
;
Janeiro, FM
;
Serra, AC
;
PUBLISHED:
2007
,
SOURCE:
15th IMEKO TC4 Symposium on Novelties in Electrical Measurements and Instrumentation
in
15th IMEKO TC4 Symposium on Novelties in Electrical Measurements and Instrumentation
INDEXED IN:
Scopus
IN MY:
ORCID
37
TITLE:
Implementation of a DSP based impedance measurement instrument using ellipse fitting algorithms
AUTHORS:
Ramos, PM
;
Janeiro, FM
;
Tlemcani, M
;
Cruz Serra, A
;
PUBLISHED:
2007
,
SOURCE:
15th IMEKO Symposium on Novelties in Electrical Measurements and Instrumentation in Parallel with the 12th Workshop on ADC Modelling and Testing
in
15th IMEKO Symposium on Novelties in Electrical Measurements and Instrumentation in Parallel with the 12th Workshop on ADC Modelling and Testing
INDEXED IN:
Scopus
IN MY:
ORCID
38
TITLE:
Least squares multiharmonic fitting: Convergence improvements
AUTHORS:
Pedro M Ramos
;
Cruz C Serra
;
PUBLISHED:
2007
,
SOURCE:
23rd IEEE Instrumentation and Measurement Technology Conference
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
56,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
39
TITLE:
On-line detection and classification of power quality disturbances in a single-phase power system
AUTHORS:
Tomas Radil
; Vaclav Matz;
Fernando M Janeiro
;
Pedro Ramos
;
Cruz C Serra
;
PUBLISHED:
2007
,
SOURCE:
International Conference on Power Engineering Energy and Electrical Devices
in
POWERENG2007: INTERNATIONAL CONFERENCE ON POWER ENGINEERING - ENERGY AND ELECTRICAL DRIVES PROCEEDINGS, VOLS 1 & 2
INDEXED IN:
WOS
40
TITLE:
On-line detection and classification of power quality disturbances in a single-phase power system
AUTHORS:
Radii, T; Matz, V;
Janeiro, FM
;
Ramos, P
;
Serra, AC
;
PUBLISHED:
2007
,
SOURCE:
International Conference on Power Engineering, Energy and Electrical Drives, POWERENG 2007
in
POWERENG 2007 - International Conference on Power Engineering - Energy and Electrical Drives Proceedings
INDEXED IN:
Scopus
IN MY:
ORCID
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