António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



81
TITLE: Dual tone analysis for phase-plane coverage in ADC metrological characterization
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
82
TITLE: Error correction technique for dynamic impedance measurement
AUTHORS: Quaresma, H; Silva, AP; Serra, AC ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
83
TITLE: Introduction to the special issue on ADC testing, 6th EuroWorkshop on ADC Modelling and Testing  Full Text
AUTHORS: Serra, AC ;
PUBLISHED: 2003, SOURCE: EWADC in COMPUTER STANDARDS & INTERFACES, VOLUME: 25, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
84
TITLE: New methods to improve convergence of sine fitting algorithms  Full Text
AUTHORS: da Silva, MF; Serra, AC ;
PUBLISHED: 2003, SOURCE: 6th Euro Workshop on ADC Modelling and Testing (EWADC in COMPUTER STANDARDS & INTERFACES, VOLUME: 25, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
85
TITLE: Performance of data acquisition systems from user's point of view
AUTHORS: Alegria, F ; Girao, P; Haasz, V; Serra, A ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
86
TITLE: Representation and measurement of nonlinearities in stimulus signals
AUTHORS: Martins, RC ; Serra, AMD ;
PUBLISHED: 2003, SOURCE: 19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
87
TITLE: Variance of the cumulative histogram of ADCs due to frequency errors
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2003, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
88
TITLE: A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
89
TITLE: An ADC histogram test based on small-amplitude waves  Full Text
AUTHORS: Alegria, FC ; Arpaia, P; Daponte, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: 16th IMEKO World Congress in MEASUREMENT, VOLUME: 31, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
90
TITLE: Dithering performance of oversampled ADC systems affected by hysteresis  Full Text
AUTHORS: Pereira, JMD; Girao, PS ; Serra, AC ;
PUBLISHED: 2002, SOURCE: MEASUREMENT, VOLUME: 32, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Page 9 of 13. Total results: 125.

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