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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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IF Scopus Dsc
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Confirmed Publications: 597
341
TITLE:
Simulation of deep resonances in elastic backscattering data
Full Text
AUTHORS:
Barradas, NP
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
17th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
249,
ISSUE:
1-2 SPEC. ISS.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
342
TITLE:
Stability and luminescence studies of Tm and Er implanted ZnO single crystals
Full Text
AUTHORS:
Rita, E
;
Alves, E
;
Wahl, U
;
Correia, JG
;
Monteiro, T
;
Soares, MJ
;
Neves, A
;
Peres, M
;
PUBLISHED:
2006
,
SOURCE:
14th International Conference on Ion Beam Modification of Materials (IBMM 2004)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
242,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
:
18
IN MY:
ORCID
|
ResearcherID
343
TITLE:
Structural and optical characterization of light emitting InGaN/GaN epitaxial layers
AUTHORS:
Pereira, S
;
Correia, MR
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM)
in
ADVANCED MATERIALS FORUM III, PTS 1 AND 2,
VOLUME:
514-516,
ISSUE:
PART 1
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
344
TITLE:
Structural evolution in ZrNxOy thin films as a function of temperature
Full Text
AUTHORS:
Cunha, L
;
Vaz, F
;
Moura, C
;
Rebouta, L
;
Carvalho, P
;
Alves, E
;
Cavaleiro, A
;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
:
39
IN MY:
ORCID
|
ResearcherID
345
TITLE:
Structure and optical properties of sapphire implanted with boron at room temperature and 1000 degrees C
Full Text
AUTHORS:
Carl J McHargue
;
Alves, E
; Ononye, LC;
Marques, C
;
PUBLISHED:
2006
,
SOURCE:
13th International Conference on Radiation Effects in Insulators (REI-2005)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
250,
ISSUE:
1-2 SPEC. ISS.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
346
TITLE:
Structure and role of ultrathin AlN layers for improving optical activation of rare earth implanted GaN
Full Text
AUTHORS:
Wojtowicz, T
;
Gloux, F
;
Ruterana, P
;
Nouet, G
; Bodiou, L; Braud, A;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
6th International Conference on Nitride Semiconductors (ICNS-6)
in
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
VOLUME:
243,
ISSUE:
7
INDEXED IN:
Scopus
WOS
IN MY:
ResearcherID
347
TITLE:
Study of the oxygen role in the photoluminescence of erbium doped nanocrystalline silicon embedded in a silicon amorphous matrix
Full Text
AUTHORS:
Cerqueira, MF
; Losurdo, M;
Monteiro, T
; Stepikhova, M;
Soares, MJ
;
Peres, M
;
Alves, E
;
Conde, O
;
PUBLISHED:
2006
,
SOURCE:
21st International Conference on Amorphous and Nanocrystalline Semiconductors
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
VOLUME:
352,
ISSUE:
9-20
INDEXED IN:
Scopus
WOS
CrossRef
:
2
IN MY:
ORCID
|
ResearcherID
348
TITLE:
Synthesis, surface modification and optical properties of Tb3+-doped ZnO nanocrystals
Full Text
AUTHORS:
Pereira, AS
;
Peres, M
;
Soares, MJ
;
Alves, E
;
Neves, A
;
Monteiro, T
;
Trindade, T
;
PUBLISHED:
2006
,
SOURCE:
NANOTECHNOLOGY,
VOLUME:
17,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
:
60
IN MY:
ORCID
|
ResearcherID
349
TITLE:
TEM investigation of Tm implanted GaN, the influence of high temperature annealing
Full Text
AUTHORS:
Wojtowicz, T; Gloux, F; Ruterana, P;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
Scopus
WOS
IN MY:
ResearcherID
350
TITLE:
The structure of crystallographic damage in GaN formed during rare earth ion implantation with and without an ultrathin AlN capping layer
Full Text
AUTHORS:
Gloux, F
;
Ruterana, P
;
Wojtowicz, T
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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