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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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Order:
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Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
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Confirmed Publications: 597
351
TITLE:
Transmission electron microscopy investigation of the structural damage formed in GaN by medium range energy rare earth ion implantation
Full Text
AUTHORS:
Gloux, F
;
Wojtowicz, T
;
Ruterana, P
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
100,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
352
TITLE:
Transparent thin film transistors based on indium oxide semiconductor
Full Text
AUTHORS:
Lavareda, G
;
Nunes N de Carvalho
;
Fortunato, E
;
Ramos, AR
;
Alves, E
;
Conde, O
;
Amaral, A
;
PUBLISHED:
2006
,
SOURCE:
1st Conference on Advances in Optical Materials (AIOM)
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
VOLUME:
352,
ISSUE:
23-25
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
353
TITLE:
Tribocorrosion behaviour of ZrOxNy thin films for decorative applications
Full Text
AUTHORS:
Ferreira, SC
;
Ariza, E
;
Rocha, LA
;
Gomes, JR
;
Carvalho, P
;
Vaz, F
;
Fernandes, AC
;
Rebouta, L
;
Cunha, L
;
Alves, E
;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
Symposium on Protective Coatings and Thin Films held at the E-MRS Spring Meeting
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
22-23
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
354
TITLE:
UV-Raman scattering study of lattice recovery by thermal annealing of Eu+-implanted GaN layers
Full Text
AUTHORS:
Pastor, D
; Hernandez, S; Cusco, R; Artus, L;
Martin, RW
; O'Donnell, KP; Briot, O;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
355
TITLE:
X-ray diffraction study of ordered antiferromagnets for tunnel junctions
AUTHORS:
Franco, N
;
Alves, E
; Rickart, M;
Guedes, A
;
Freitas, PP
;
Barradas, NP
;
PUBLISHED:
2006
,
SOURCE:
3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM)
in
ADVANCED MATERIALS FORUM III, PTS 1 AND 2,
VOLUME:
514-516,
ISSUE:
PART 1
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
356
TITLE:
A green-emitting CdSe/poly(butyl acrylate) nanocomposite
Full Text
AUTHORS:
Peres, M
;
Costa, LC
;
Neves, A
;
Soares, MJ
;
Monteiro, T
;
Esteves, AC
;
Barros Timmons, A
;
Trindade, T
;
Kholkin, A
;
Alves, E
;
PUBLISHED:
2005
,
SOURCE:
NANOTECHNOLOGY,
VOLUME:
16,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
:
19
IN MY:
ORCID
|
ResearcherID
357
TITLE:
Analysis of nanolayered samples with a He-4 beam
Full Text
AUTHORS:
Franco, N
;
Gouveia, JAA
;
Alves, E
;
Cardoso, S
;
Freitas, PP
;
Barradas, NP
;
PUBLISHED:
2005
,
SOURCE:
18th International Conference on Application of Accelerators in Research and Industry (CAARI)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
241,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
358
TITLE:
Annealing properties of ZnO films grown using diethyl zinc and tertiary butanol
Full Text
AUTHORS:
Wang, JZ
;
Peres, M
;
Soares, J
; Gorochov, O;
Barradas, NP
;
Alves, E
; Lewis, JE;
Fortunato, E
;
Neves, A
;
Monteiro, T
;
PUBLISHED:
2005
,
SOURCE:
JOURNAL OF PHYSICS-CONDENSED MATTER,
VOLUME:
17,
ISSUE:
10
INDEXED IN:
Scopus
WOS
CrossRef
:
13
IN MY:
ORCID
|
ResearcherID
359
TITLE:
Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles
Full Text
AUTHORS:
Ganeev, RA
;
Ryasnyansky, AI
; Stepanov, AL;
Marques, C
;
da Silva, RC
;
Alves, E
;
PUBLISHED:
2005
,
SOURCE:
OPTICS COMMUNICATIONS,
VOLUME:
253,
ISSUE:
1-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
360
TITLE:
Beyond single scattering off flat samples
Full Text
AUTHORS:
Barradas, NP
;
Fonseca, A
;
Franco, N
;
Alves, E
;
PUBLISHED:
2005
,
SOURCE:
18th International Conference on Application of Accelerators in Research and Industry (CAARI)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
241,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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