José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 100



71
TITLE: A method for the in-circuit testing of σδ modulators
AUTHORS: Da Silva, JM ; Duarte, JS; Matos, JS;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
IN MY: ORCID
72
TITLE: ADC testing using joint time-frequency analysis
AUTHORS: Hélio Sousa Mendonça; José Machado da Silva ; José Silva Matos;
PUBLISHED: 2001, SOURCE: Comput. Stand. Interfaces, VOLUME: 23, ISSUE: 2
INDEXED IN: DBLP
IN MY: DBLP
73
TITLE: ADC testing using joint time-frequency analysis  Full Text
AUTHORS: Mendonca, H ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2001, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 23, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
74
TITLE: Differential gain and phase testing using joint time-frequency analysis
AUTHORS: Mendonca, HS ; Silva, JM ; Matos, JS;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
75
TITLE: DYNAD: a Framework IVSMT project addressed to the development of dynamic test techniques for analog-to-digital converters  Full Text
AUTHORS: Morandi, C; Chiorboli, G; Dallet, D; Haddadi, D; Mazzoleni, S; da Silva, JM ; Pernull, H; Roy, PY;
PUBLISHED: 2000, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 22, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID
76
TITLE: Mixed-Signal BIST Using Correlation and Reconfigurable Hardware
AUTHORS: José Machado da Silva ; Soeiro S Duarte; José Silva Matos ;
PUBLISHED: 2000, SOURCE: Design, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 in 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France
INDEXED IN: Scopus DBLP CrossRef
IN MY: DBLP
77
TITLE: ADC testing using joint time-frequency analysis
AUTHORS: Mendonca, HS ; Silva, JM ; Matos, JS ;
PUBLISHED: 1999, SOURCE: 3rd International Conference on Advanced A/D and D/A Conversion Techniques and their Applications in THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS, ISSUE: 466
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
78
TITLE: Mixed-Signal Board Level DfT Techniques Using IEEE P1149.4
AUTHORS: José Silva Matos; José Machado da Silva ;
PUBLISHED: 1998, SOURCE: 5th IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998, Surfing the Waves of Science and Technology, Lisbon, Portugal, September 7-10, 1998
INDEXED IN: DBLP
IN MY: DBLP
79
TITLE: Mixed-signal board level DfT techniques using IEEE P1149.4
AUTHORS: Matos Jose, S; da Silva Jose Machado ;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
80
Page 8 of 10. Total results: 100.

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