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TITLE: Damage formation and recovery in Fe implanted 6H-SiC  Full Text
AUTHORS: Miranda, P; Wahl, U ; Catarino, N; Lorenz, K ; Correia, JG ; Alves, E ;
PUBLISHED: 2012, SOURCE: 16th International Conference on Radiation Effects in Insulators (REI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 286
INDEXED IN: Scopus WOS CrossRef
12
TITLE: Damage formation in GaN under medium energy range implantation of rare earth ions: A combined TEM, XRD and RBS/C investigation
AUTHORS: Lacroix, B; Leclerc, S; Ruterana, P; Declemy, A; Miranda, SMC; Lorenz, K ; Alves, E ;
PUBLISHED: 2012, SOURCE: 2011 MRS Spring Meeting in Materials Research Society Symposium Proceedings, VOLUME: 1342
INDEXED IN: Scopus CrossRef
IN MY: ORCID
13
TITLE: High precision determination of the InN content of Al1-xInxN thin films by Rutherford backscattering spectrometry  Full Text
AUTHORS: Magalhaes, S; Barradas, NP ; Alves, E ; Watson, IM; Lorenz, K ;
PUBLISHED: 2012, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 273
INDEXED IN: Scopus WOS
14
TITLE: High pressure annealing of Europium implanted GaN
AUTHORS: Lorenz, K ; Miranda, SMC; Alves, E ; Roqan, IS; O'Donnell, KP; Bockowski, M;
PUBLISHED: 2012, SOURCE: Conference on Gallium Nitride Materials and Devices VII in GALLIUM NITRIDE MATERIALS AND DEVICES VII, VOLUME: 8262
INDEXED IN: Scopus WOS CrossRef
15
TITLE: Ion beams as a tool for the characterization of near-pseudomorphic CdZnO epilayers
AUTHORS: Redondo Cubero, A; Brandt, M; Henneberger, F; Alves, E ; Lorenz, K ;
PUBLISHED: 2012, SOURCE: Conference on Oxide-Based Materials and Devices III in OXIDE-BASED MATERIALS AND DEVICES III, VOLUME: 8263
INDEXED IN: Scopus WOS
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TITLE: It's not easy being green: Strategies for all-nitrides, all-colour solid state lighting  Full Text
AUTHORS: O'Donnell, KP; Auf der Maur, M; Di Carlo, A; Lorenz, K ; the SORBET consortium, ;
PUBLISHED: 2012, SOURCE: PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, VOLUME: 6, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
17
TITLE: Mechanisms of damage formation in Eu-implanted AlN  Full Text
AUTHORS: Leclerc, S; Lacroix, B; Declemy, A; Lorenz, K ; Ruterana, P;
PUBLISHED: 2012, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 112, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef
18
TITLE: Rare earth co-doping nitride layers for visible light  Full Text
AUTHORS: Rodrigues, J; Miranda, SMC; Santos, NF; Neves, AJ ; Alves, E ; Lorenz, K ; Monteiro, T ;
PUBLISHED: 2012, SOURCE: MATERIALS CHEMISTRY AND PHYSICS, VOLUME: 134, ISSUE: 2-3
INDEXED IN: Scopus WOS CrossRef: 10
19
TITLE: Single phase alpha-plane MgZnO epilayers for UV optoelectronics: substitutional behaviour of Mg at large contents
AUTHORS: Redondo Cubero, A ; Hierro, A; M Chauveau; Lorenz, K ; Tabares, G; Franco, N; Alves, E ; Munoz, E;
PUBLISHED: 2012, SOURCE: CRYSTENGCOMM, VOLUME: 14, ISSUE: 5
INDEXED IN: Scopus WOS
20
TITLE: Unintentional incorporation of H and related structural and free-electron properties of c- and a-plane InN  Full Text
AUTHORS: Darakchieva, V; Lorenz, K ; Y Xie; Alves, E ; Schaff, WJ; Yamaguchi, T; Nanishi, Y; Ruffenach, S; Moret, M; Briot, O;
PUBLISHED: 2012, SOURCE: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 209, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
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