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TITLE: An insider view of the Portuguese ion beam laboratory
AUTHORS: Alves, E; Lorenz, K; Catarino, N; Peres, M; Dias, M; Mateus, R; Alves, LC; Corregidor, V; Barradas, NP; Fonseca, M; Cruz, J ; Jesus, A;
PUBLISHED: 2021, SOURCE: EUROPEAN PHYSICAL JOURNAL PLUS, VOLUME: 136, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
2
TITLE: In Situ Characterization and Modification of -Ga2O3 Flakes Using an Ion Micro-Probe  Full Text
AUTHORS: Peres, M; Alves, LC; Rocha, F; Catarino, N; Cruz, C; Alves, E; Silva, AG ; Villora, EG; Shimamura, K; Lorenz, K;
PUBLISHED: 2018, SOURCE: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 215, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef: 5
3
TITLE: Electrical characterization of molybdenum oxide lamellar crystals irradiated with UV light and proton beams  Full Text
AUTHORS: Pereira, DR; Peres, M; Alves, LC; Correia, JG; Diaz Guerra, C; Silva, AG ; Alves, E; Lorenz, K;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
INDEXED IN: Scopus WOS CrossRef: 4
4
TITLE: Improving the Unreasonable University
AUTHORS: Manuel P Alonso; Mario J Pinheiro; Rui F M Lobo; Joshua Spodek;
PUBLISHED: 2018, SOURCE: 3rd International Conference of the Portuguese-Society-for-Engineering-Education (CISPEE) in 2018 3RD INTERNATIONAL CONFERENCE OF THE PORTUGUESE SOCIETY FOR ENGINEERING EDUCATION (CISPEE)
INDEXED IN: WOS
5
TITLE: Quantitative x-ray diffraction analysis of bimodal damage distributions in Tm implanted Al0.15Ga0.85N  Full Text
AUTHORS: Magalhaes, S; Fialho, M; Peres, M; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 49, ISSUE: 13
INDEXED IN: WOS
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TITLE: Quantitative x-ray diffraction analysis of bimodal damage distributions in Tm implanted Al0.15Ga0.85N
AUTHORS: Magalha∼es, S; Fialho, M; Peres, M; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: Journal of Physics D: Applied Physics, VOLUME: 49, ISSUE: 13
INDEXED IN: Scopus
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TITLE: Analysis of the electron temperature measurement in TCABR tokamak by Electron Cyclotron Emission and Infrared Thomson scattering diagnostics  Full Text
AUTHORS: Usuriaga, OC; Borges, FO; Elfimov, AG; da Silva, RP; Ono, MH; Puglia, PGPP; Alonso, MP; Severo, JHF; Nascimento, IC; Sanada, EK; de Sa, WP; Galvao, RMO; Elizondo, JI;
PUBLISHED: 2014, SOURCE: 15th International Congress on Plasma Physics (ICPP) / 13th Latin American Workshop on Plasma Physics (LAWPP) in 15TH INTERNATIONAL CONGRESS ON PLASMA PHYSICS (ICPP2010) & 13TH LATIN AMERICAN WORKSHOP ON PLASMA PHYSICS (LAWPP2010), VOLUME: 511, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
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TITLE: High optical and structural quality of GaN epilayers grown on ((2)over-bar01) beta-Ga2O3  Full Text
AUTHORS: Muhammed, MM; Peres, M; Yamashita, Y; Morishima, Y; Sato, S; Franco, N; Lorenz, K; Kuramata, A; Roqan, IS;
PUBLISHED: 2014, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 105, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef