Marco Paulo Seabra dos Reis
AuthID: R-000-ABV
91
TITLE: Optimal Selection of Time Resolution for Batch Data Analysis. Part I: Predictive Modeling
AUTHORS: Rato, TJ; Reis, MS;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
AUTHORS: Rato, TJ; Reis, MS;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
92
TITLE: Assessing the Value of Information of Data-Centric Activities in the Chemical Processing Industry 4.0
AUTHORS: Reis, MS; Kenett, R;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
AUTHORS: Reis, MS; Kenett, R;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
93
TITLE: A Systematic Framework for Assessing the Quality of Information in Data-Driven Applications for the Industry 4.0
AUTHORS: Reis, MS;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
AUTHORS: Reis, MS;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
94
TITLE: Multiresolution Analytics for Large Scale Industrial Processes
AUTHORS: Reis, MS; Rato, TJ;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
AUTHORS: Reis, MS; Rato, TJ;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
95
TITLE: Advanced Run-to-Run Controller in Semiconductor Manufacturing with Real-time Equipment Condition APC: Advanced Process Control; AM: Advanced Metrology
AUTHORS: Yang, WT; Blue, J; Roussy, A; Reis, M; Pinaton, J;
PUBLISHED: 2018, SOURCE: 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) in 2018 29TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC)
AUTHORS: Yang, WT; Blue, J; Roussy, A; Reis, M; Pinaton, J;
PUBLISHED: 2018, SOURCE: 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) in 2018 29TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC)
96
TITLE: From another quality dimension
AUTHORS: Sampaio, P; Saraiva, P; Cubo, C; Reis, M;
PUBLISHED: 2018, SOURCE: Quality Progress, VOLUME: 51, ISSUE: 12
AUTHORS: Sampaio, P; Saraiva, P; Cubo, C; Reis, M;
PUBLISHED: 2018, SOURCE: Quality Progress, VOLUME: 51, ISSUE: 12
INDEXED IN: 
Scopus
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ORCID
ORCID97
TITLE: Pellet shape classification using deep neural networks
AUTHORS: Colegrove, B; Lu, B; Broadway, M; Castillo, I; Chiang, L; Rendall, R; Reis, MS;
PUBLISHED: 2018, SOURCE: 2018 Society of Plastics Engineers Annual Technical Conference, ANTEC 2018 in Annual Technical Conference - ANTEC, Conference Proceedings, VOLUME: 2018-May
AUTHORS: Colegrove, B; Lu, B; Broadway, M; Castillo, I; Chiang, L; Rendall, R; Reis, MS;
PUBLISHED: 2018, SOURCE: 2018 Society of Plastics Engineers Annual Technical Conference, ANTEC 2018 in Annual Technical Conference - ANTEC, Conference Proceedings, VOLUME: 2018-May
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID99
TITLE: Markovian and Non-Markovian sensitivity enhancing transformations for process monitoring
AUTHORS: Rato, TJ; Reis, MS;
PUBLISHED: 2017, SOURCE: CHEMICAL ENGINEERING SCIENCE, VOLUME: 163
AUTHORS: Rato, TJ; Reis, MS;
PUBLISHED: 2017, SOURCE: CHEMICAL ENGINEERING SCIENCE, VOLUME: 163
100
TITLE: Assessment and Prediction of Lubricant Oil Properties Using Infrared Spectroscopy and Advanced Predictive Analytics
AUTHORS: Pinheiro, CT; Rendall, R; Quina, MJ; Reis, MS; Gando Ferreira, LM;
PUBLISHED: 2017, SOURCE: ENERGY & FUELS, VOLUME: 31, ISSUE: 1
AUTHORS: Pinheiro, CT; Rendall, R; Quina, MJ; Reis, MS; Gando Ferreira, LM;
PUBLISHED: 2017, SOURCE: ENERGY & FUELS, VOLUME: 31, ISSUE: 1
