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TITLE: Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering  Full Text
AUTHORS: Barradas, NP ; Alves, E ; Pereira, S ; Shvartsman, VV; Kholkin, AL ; Pereira, E; O'Donnell, KP; Liu, C; Deatcher, CJ; Watson, IM; Mayer, M;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef: 28
233
TITLE: A new interlayer approach for CVD diamond coating of steel substrates  Full Text
AUTHORS: Silva, FJG ; Fernandes, AJS; Costa, FM ; Baptista, APM ; Pereira, E;
PUBLISHED: 2004, SOURCE: 14th European Conference on Diamond, Diamond-like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide in DIAMOND AND RELATED MATERIALS, VOLUME: 13, ISSUE: 4-8
INDEXED IN: Scopus WOS CrossRef: 21
235
TITLE: Raman study of the A(1)(LO) phonon in relaxed and pseudomorphic InGaN epilayers  Full Text
AUTHORS: Correia, MR ; Pereira, S ; Pereira, E; Frandon, J; Alves, E ;
PUBLISHED: 2003, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 83, ISSUE: 23
INDEXED IN: Scopus WOS CrossRef: 37
236
TITLE: Tribological behaviour of CVD diamond films on steel substrates  Full Text
AUTHORS: Silva, FJG ; Fernandes, AJS; Costa, FM ; Teixeira, V ; Baptista, APM ; Pereira, E;
PUBLISHED: 2003, SOURCE: 14th International Conference on Wear of Materials in WEAR, VOLUME: 255, ISSUE: 7-12
INDEXED IN: Scopus WOS CrossRef: 14
237
TITLE: Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping (vol 80, pg 3913, 2002)  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Sequeira, AD; Franco, N; Watson, IM; Deatcher, CJ;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 8
238
TITLE: Depth profiling InGaN/GaN multiple quantum wells by Rutherford backscattering: The role of intermixing  Full Text
AUTHORS: Pereira, S ; Pereira, E; Alves, E ; Barradas, NP ; O'Donnell, KP; Liu, C; Deatcher, CJ; Watson, IM;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 16
INDEXED IN: Scopus WOS CrossRef: 12
240
TITLE: Structural and optical properties of InGaN/GaN layers close to the critical layer thickness  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; Trager Cowan, C; Sweeney, F; O'Donnell, KP; Alves, E ; Franco, N; Sequeira, AD;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef: 85
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